Semiconductor
Full Automatic Wafer Probing Machine UF200R
Fully automatic wafer prober capable to handle wafers from 120mm to 200mm that provides a high rigid wafer prober at industry leading cost performance. A flexible wafer prober designed to cover a wide range of semiconductor application will be a key enabler for effective and efficient operations.
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It performs transfer and testing on 5 to 8 inch wafer.
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Testing environment can be adopted to suit high (up to 150C) to low (down to -40C) probing temperature
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4 inch wafer probing capability
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Transfer of warpage and ultrathin wafer by the special transfer mechanism
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Testing environment for minute electric current
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High-voltage testing environment
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Wide variety of network environment
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Needle track inspecting function