Metrology
Opt-Scope Rex st400
3D white light Interference Microscope for Nano level surface roughness measuring.
- Electric XY stage size up to 400 X 400 mm.
- Compliant to ISO 25178-2 / JIS B 0681-2 on 3D Surface Texture Parameters.
- Using Original Peak Detection Algorithm of interference (DEAP).
- Continuous Measurement and Stitching Functions.
- 6X High Speed Camera can be select (Optional)