Opt-Scope R

3D White Light Interference Microscope for Nano Level Surface Roughness

• Compliant to ISO 25178-2/JIS B 0681-2 on 3D surface texture parameters.
• Using Original Peak Detection Algorithm of interference fringe (DEAP).
• Continuous Measurement and stitching function.
• Vertical Resolution up to 0.01 nm.
• High Speed Camera (option)