Metrology
Opt-Scope R
3D White Light Interference Microscope for Nano Level Surface Roughness
- Compliant to ISO 25178-2/JIS B 0681-2 on 3D surface texture parameters.
- Using Original Peak Detection Algorithm of interference fringe (DEAP).
- Continuous Measurement and stitching function.
- Vertical Resolution up to 0.01 nm.
- High Speed Camera (option)
